Orbotech Ultra Discovery VM other industrial equipment
Munich
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Marke: Orbotech
Manufacturer
Orbotech
Model
Ultra Discovery VM
Year of Manufacture
2011
Ultra Discovery VM delivers simple
intelligent
and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA
PBGA
CSP
and COF production
Delivering super clear images essential for capturing the finest defects
the system achieves outstanding AOI results with minimal effort or training
even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized
saving precious verification time
Benefits
High throughput and superior detection with a minimal number of false calls
Especially designed for inspection of the finest lines down to 10 µm
Quick setup even for the most complicated jobs for higher productivity
Automation ready
Very high uptime
SIP Technology
Push-to-Scan
A “no setup” process
Top AOI results with minimal effort or training
The easiest
user-friendly interface (GUI)
Full “Step and Repeat” functions
Visual Intelligence
Using SIP Technology
Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA
PBGA/CSP
and COF production. With the Visual Intelligence Detection Engine
now dedicated for IC substrate applications
manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI
detect all you want
and only what you want
Ultra Discovery VM is equipped with a super-fast optical head
which together with its dedicated IC substrate panel understanding
delivers exceptionally high throughput
superior detection
and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens
featuring unique wide-angle illumination
delivers very clear images essential for capturing the finest defects
Visual Intelligence
Full panel understanding
context-based detection engine
Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
Find more here
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